Results for "electron-transparent zone"
- ETZ: electron-transparent zone
- TEM: Transparent Electron Microscope
- ETM: Electron Transparent Mirrors
- EBFZ: Electron Beam Floating Zone
- EBZM: Electron Beam Zone Melting
- EBZM: Electron-Beam Zone Melting
- EBFZM: Electron Beam Floating Zone Melting
- ZOLZ-CBEDP: Zero-Order Laue Zone-Convergent-Beam Electron Diffraction Pattern
- STEM-EELS: Scanning Transmission Electron Microscopy- Electron Energy Loss Spectros-copy
- REMEDIE: Reflection Electron Microscopy and Electron Diffraction at Intermediate Energy
- CTEM-LACBED: Conventional Transmission Electron Microscopy/Large-Angle Convergent-Beam Electron Diffraction
- SEM-EBIC: Scanning Electron Microscopy Electron Beam-Induced Current
- EAAPS: Electron-excited Auger-electron Appearance Potential Spectroscopy
- TEM-SAED: Transmission Electron Microscope/Selected Area Electron Diffraction
- TEM-EELS: Transmission Electron Microscopy-Electron Energy Loss Spectroscopy
- TEM-EBIC: Transmission Electron Microscopy-Electron Beam Induced Current
- MEED/AES: Medium Energy Electron Diffraction/Auger Electron Spectroscopy
- AEM-EELS: Analytical Electron Microscopy-Electron Energy Loss Spectroscopy
- AES-LEED: Auger Electron Spectroscopy-Low-Energy Electron Diffraction
- SEM-BEI: Scanning Electron Microscopy-Backscattered Electron Image
- SEM-EBSP: Scanning Electron Microscopy-Electron Backscattered Spectroscopy
- SEM-ECP: Scanning Electron Microscopy Electron Channeling Pattern
- CESVEC: Conversion Electron Spectroscopy of Valence Electron Configurations
- AES-E: Auger Electron Spectroscopy with Electron Excitation
- EAES: Electron-excited Auger Electron Spectroscopy
- EIAES: Electron induced Auger electron spectroscopy
- EEAES: Electron-excited Auger electron spectroscopy
- ELDOR: electron-electron double resonance
- DEER: double electron-electron resonance
- EEDR: Electron-Electron Double Resonance
- DEER: Double Electron–Electron Resonance
- DEER: Double Electron Electron Resonance
- LEEM/PEEM: Low-Energy Electron Microscopy/Photo-Electron Emission Microscopy
- REM-RHEED: Reflection Electron Microscopy-Reflection High-Energy Electron Diffraction
- SCEP-CEPA: Self-Consistent Electron-Pair Coupled Electron Pair Approxiomation
- ENDORIESR: Electron-Nuclear Double Resonance Induced Electron Spin Resonance
- AEM/HREM: Analytical Electron Microscopy/ High-Resolution Electron Microscopy
- AEM/HREM: Analytical Electron Microscope/High-Resolution Electron Microscope
- EEI: Electron-Electron Interaction
- EER: Electron-Electron Repulsion
- NT: No transparent
- T: Transparent
- X: transparent
- Trans: Transparent
- TT: Transparent testa
- TA: Transparent amber
- TW: Transparent World
- TN: Transparent Neighbor
- AT: All Transparent
- MT: Mandarin Transparent
- SHOW MORE