Results for "Electron-Volt"
- EV: Electron-Volt
- eV: electron volt
- MeV: Milli electron volt
- KEV: Kilo Electron Volt
- GeV: Giga electron Volt
- GEV: Giga-Electron Volt
- MEV: Mega Electron-Volt
- BEV: Billion Electron Volt
- GEV: Giga Electron-Volt
- TEV: Tera Electron Volt
- 5EV: Five Electron Volt
- MeV: Million Electron Volt
- KEV: Kilo-Electron Volt
- TEV: Tera-Electron Volt
- PeV: Peta Electron Volt
- TEV: Trillion Electron Volt
- MeV: mega electron volt
- GEV: Giga-Electron-Volt
- EVS: Electron Volt Spectrometer
- MEV: Meg Electron Volt
- KEV: Kilo Electron-Volt
- eV/atom: electron volt per atom
- eV/s: electron-volt per second
- eV/T: electron-volt per Tesla
- eV/sec: electron volt per second
- eV-fu: electron-volt functional unit
- eV/at: electron volt per atom
- eV/K: electron-volt per kelvin
- MVEM: Million Volt Electron Microscope
- EVNS: Electron Volt Neutron Spectroscopy
- eV/au: electron volt per atomic unit
- STEM-EELS: Scanning Transmission Electron Microscopy- Electron Energy Loss Spectros-copy
- REMEDIE: Reflection Electron Microscopy and Electron Diffraction at Intermediate Energy
- CTEM-LACBED: Conventional Transmission Electron Microscopy/Large-Angle Convergent-Beam Electron Diffraction
- SEM-EBIC: Scanning Electron Microscopy Electron Beam-Induced Current
- AEM-EELS: Analytical Electron Microscopy-Electron Energy Loss Spectroscopy
- EAAPS: Electron-excited Auger-electron Appearance Potential Spectroscopy
- AES-LEED: Auger Electron Spectroscopy-Low-Energy Electron Diffraction
- MEED/AES: Medium Energy Electron Diffraction/Auger Electron Spectroscopy
- TEM-EELS: Transmission Electron Microscopy-Electron Energy Loss Spectroscopy
- TEM-SAED: Transmission Electron Microscope/Selected Area Electron Diffraction
- TEM-EBIC: Transmission Electron Microscopy-Electron Beam Induced Current
- AES-E: Auger Electron Spectroscopy with Electron Excitation
- SEM-BEI: Scanning Electron Microscopy-Backscattered Electron Image
- SEM-EBSP: Scanning Electron Microscopy-Electron Backscattered Spectroscopy
- CESVEC: Conversion Electron Spectroscopy of Valence Electron Configurations
- SEM-ECP: Scanning Electron Microscopy Electron Channeling Pattern
- EAES: Electron-excited Auger Electron Spectroscopy
- EEAES: Electron-excited Auger electron spectroscopy
- EIAES: Electron induced Auger electron spectroscopy
- SHOW MORE