Results for "Electron Image"
- SEM-BEI: Scanning Electron Microscopy-Backscattered Electron Image
- EI: Electron Image
- BEI: backscattered electron image
- SEI: secondary electron image
- SIEM: Shadow Image Electron Microscopy
- EIAS: Electron Image Acquiring System
- EPID: Electron Portal Image Devices
- BSEI: Back Scattered Electron Image
- EBRIC: electron beam recorder image correction
- STEI: Scanned Tip and Electron Image
- EMIA: Electron Microscope and Image Analysis
- IISEI: Ion Induced Secondary Electron Image
- EMIAC: Electron Microscope and Image Analysis Center
- SEMICAPS: Scanning Electron Microscope Image Collection and Processing System
- STEM-EELS: Scanning Transmission Electron Microscopy- Electron Energy Loss Spectros-copy
- REMEDIE: Reflection Electron Microscopy and Electron Diffraction at Intermediate Energy
- CTEM-LACBED: Conventional Transmission Electron Microscopy/Large-Angle Convergent-Beam Electron Diffraction
- SEM-EBIC: Scanning Electron Microscopy Electron Beam-Induced Current
- EAAPS: Electron-excited Auger-electron Appearance Potential Spectroscopy
- AES-LEED: Auger Electron Spectroscopy-Low-Energy Electron Diffraction
- MEED/AES: Medium Energy Electron Diffraction/Auger Electron Spectroscopy
- TEM-SAED: Transmission Electron Microscope/Selected Area Electron Diffraction
- AEM-EELS: Analytical Electron Microscopy-Electron Energy Loss Spectroscopy
- TEM-EELS: Transmission Electron Microscopy-Electron Energy Loss Spectroscopy
- TEM-EBIC: Transmission Electron Microscopy-Electron Beam Induced Current
- AES-E: Auger Electron Spectroscopy with Electron Excitation
- CESVEC: Conversion Electron Spectroscopy of Valence Electron Configurations
- SEM-EBSP: Scanning Electron Microscopy-Electron Backscattered Spectroscopy
- SEM-ECP: Scanning Electron Microscopy Electron Channeling Pattern
- EIAES: Electron induced Auger electron spectroscopy
- EAES: Electron-excited Auger Electron Spectroscopy
- EEAES: Electron-excited Auger electron spectroscopy
- ELDOR: electron-electron double resonance
- EEDR: Electron-Electron Double Resonance
- DEER: Double Electron–Electron Resonance
- DEER: double electron-electron resonance
- DEER: Double Electron Electron Resonance
- DICIFER: Digital Image Complex for Image Feature Extraction & Recognition
- SCEP-CEPA: Self-Consistent Electron-Pair Coupled Electron Pair Approxiomation
- ENDORIESR: Electron-Nuclear Double Resonance Induced Electron Spin Resonance
- LEEM/PEEM: Low-Energy Electron Microscopy/Photo-Electron Emission Microscopy
- REM-RHEED: Reflection Electron Microscopy-Reflection High-Energy Electron Diffraction
- DIRSIG: Digital Image and Remote Sensing Image Generation
- MIRIAD: Multichannel Image Reconstruction Image Analysis and Display
- MIRIAD: Multichannel Image Reconstruction, Image Analysis and Display
- MRISIG: Magnetic Resonance Image Synthetic Image Generator
- MIRIAD: Multichannel Image Reconstruction, Image Analysis & Display
- AEM/HREM: Analytical Electron Microscope/High-Resolution Electron Microscope
- AEM/HREM: Analytical Electron Microscopy/ High-Resolution Electron Microscopy
- NILRI: New Image Lipstick Red Image
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